{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/10572990","patent":{"patent_number":"10572990","title":"PATTERN INSPECTION APPARATUS, PATTERN POSITION MEASUREMENT APPARATUS, AERIAL IMAGE MEASUREMENT SYSTEM, METHOD FOR MEASURING AERIAL IMAGE, PATTERN POSITION REPAIRING APPARATUS, METHOD FOR REPAIRING PATTERN POSITION, AERIAL IMAGE DATA PROCESSING APPARATUS, METHOD FOR","assignee":"Unknown","inventors":["Shusuke YOSHITAKE","Manabu ISOBE","Thomas SCHERUEBL","Dirk BEYER","Sven HEISIG"],"filing_date":null,"publication_date":"2020-02-25T00:00:00.000Z","cpc_codes":[],"num_claims":null,"abstract":null},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"PATTERN INSPECTION APPARATUS, PATTERN POSITION MEASUREMENT APPARATUS, AERIAL IMAGE MEASUREMENT SYSTEM, METHOD FOR MEASURING AERIAL IMAGE, PATTERN POSITION REPAIRING APPARATUS, METHOD FOR REPAIRING PATTERN POSITION, AERIAL IMAGE DATA PROCESSING APPARATUS, METHOD FOR","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/10572990","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/10572990","citation_suggestion":"Patentable. \"PATTERN INSPECTION APPARATUS, PATTERN POSITION MEASUREMENT APPARATUS, AERIAL IMAGE MEASUREMENT SYSTEM, METHOD FOR MEASURING AERIAL IMAGE, PATTERN POSITION REPAIRING APPARATUS, METHOD FOR REPAIRING PATTERN POSITION, AERIAL IMAGE DATA PROCESSING APPARATUS, METHOD FOR\" (10572990). https://patentable.app/patents/10572990","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/10572990","json":"https://patentable.app/api/llm-context/10572990","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T01:51:44.663Z"}