{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/10748797","patent":{"patent_number":"10748797","title":"PLASMA PARAMETERS AND SKEW CHARACTERIZATION BY HIGH SPEED IMAGING","assignee":"Unknown","inventors":["Sidharth BHATIA","Edward P. HAMMOND IV","Bhaskar KUMAR","Anup Kumar SINGH","Vivek Bharat SHAH","Ganesh BALASUBRAMANIAN"],"filing_date":null,"publication_date":"2020-08-18T00:00:00.000Z","cpc_codes":[],"num_claims":null,"abstract":null},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"PLASMA PARAMETERS AND SKEW CHARACTERIZATION BY HIGH SPEED IMAGING","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/10748797","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/10748797","citation_suggestion":"Patentable. \"PLASMA PARAMETERS AND SKEW CHARACTERIZATION BY HIGH SPEED IMAGING\" (10748797). https://patentable.app/patents/10748797","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/10748797","json":"https://patentable.app/api/llm-context/10748797","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T02:42:50.751Z"}