{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10473579","patent":{"patent_number":"US-10473579","title":"Apparatus for inspecting material property of plurality of measurement objects","assignee":null,"inventors":[],"filing_date":"2018-05-16T00:00:00.000Z","publication_date":"2019-11-12T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","H01L","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":14,"abstract":"An inspection apparatus includes a light source. A first measurement unit is configured to receive light from the light source and direct it to a first measurement object. A second measurement unit is configured to receive the light from the light source and direct it to a second measurement object. An inspection unit is configured to receive a first optical signal provided from the first measurement unit and inspect the first measurement object using the first optical signal, and to receive a second optical signal provided from the second measurement unit and inspect the second measurement object using the second optical signal. A measurement position selection unit is configured to alternately enable the inspection of the two measurement units by adjusting an angle of a reflection mirror."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Apparatus for inspecting material property of plurality of measurement objects","description":"An inspection apparatus includes a light source. A first measurement unit is configured to receive light from the light source and direct it to a first measurement object. A second measurement unit is","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10473579","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10473579","citation_suggestion":"Patentable. \"Apparatus for inspecting material property of plurality of measurement objects\" (US-10473579). https://patentable.app/patents/US-10473579","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10473579","json":"https://patentable.app/api/llm-context/US-10473579","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:09:28.840Z"}