{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10473720","patent":{"patent_number":"US-10473720","title":"Dynamic independent test partition clock","assignee":null,"inventors":[],"filing_date":"2016-10-27T00:00:00.000Z","publication_date":"2019-11-12T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":12,"abstract":"In one embodiment, a test system comprises: a plurality of test partitions and a centralized controller configured to coordinate testing between the plurality of test partitions. At least one of the plurality of test partitions comprises: a partition test interface controller configured to control testing within at least one test partition in accordance with dynamic selection of a test mode, and at least one test chain configured to perform test operations. The dynamic selection of the test mode and control of testing within a test partition can be independent of selection of a test mode and control in others of the plurality of test partitions. In one embodiment, a free running clock signal is coupled to a test partition, and the partition test mode controller transforms the free running clock signal into a local partition test clock which is controlled in accordance with the dynamic selection of the test mode."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Dynamic independent test partition clock","description":"In one embodiment, a test system comprises: a plurality of test partitions and a centralized controller configured to coordinate testing between the plurality of test partitions. At least one of the p","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10473720","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10473720","citation_suggestion":"Patentable. \"Dynamic independent test partition clock\" (US-10473720). https://patentable.app/patents/US-10473720","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10473720","json":"https://patentable.app/api/llm-context/US-10473720","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T04:00:15.929Z"}