{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10474775","patent":{"patent_number":"US-10474775","title":"Method and system for modeling an electronic device under test (DUT) using a kernel method","assignee":null,"inventors":[],"filing_date":"2015-08-31T00:00:00.000Z","publication_date":"2019-11-12T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":20,"abstract":"A method provides modeling a DUT and generating a simulated response. The method includes receiving a first portion of a stimulus signal generated by a signal generator, a second portion of the stimulus signal being input to the DUT; receiving a response signal output by the DUT in response to a second portion of the stimulus signal; digitizing the received first portion and the received response signal; correcting the digitized signals; measuring training input series data of the digitized first portion of the stimulus signal and training output series data of the digitized response signal; and utilizing kernel adaptive filtering for extracting a device model from the training input and output series data, and for generating simulated responses of the DUT to subsequent stimulus inputs, respectively. The kernel adaptive filtering may include a kernel least mean squares algorithm, a kernel Affine projection algorithm or a recursive least squares algorithm."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and system for modeling an electronic device under test (DUT) using a kernel method","description":"A method provides modeling a DUT and generating a simulated response. The method includes receiving a first portion of a stimulus signal generated by a signal generator, a second portion of the stimul","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10474775","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10474775","citation_suggestion":"Patentable. \"Method and system for modeling an electronic device under test (DUT) using a kernel method\" (US-10474775). https://patentable.app/patents/US-10474775","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10474775","json":"https://patentable.app/api/llm-context/US-10474775","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T21:46:38.622Z"}