{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10481106","patent":{"patent_number":"US-10481106","title":"Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method","assignee":null,"inventors":[],"filing_date":"2017-09-01T00:00:00.000Z","publication_date":"2019-11-19T00:00:00.000Z","cpc_codes":["G01N","G01N","G06T","G01N","G06T","G06T"],"num_claims":20,"abstract":"A measurement processing device used for an X-ray inspection device includes: a region information acquisition unit that acquires first region information based on X-rays passing through a first region that is a part of a first specimen; a storage unit that stores second region information related to a second region of a second specimen, the second region being larger than the first region; and a determination unit that determines whether or not a region corresponding to the first region is included in the second region, based on the first region information and the second region information."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method","description":"A measurement processing device used for an X-ray inspection device includes: a region information acquisition unit that acquires first region information based on X-rays passing through a first regio","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10481106","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10481106","citation_suggestion":"Patentable. \"Measurement processing device, X-ray inspection device, measurement processing method, measurement processing program, and structure manufacturing method\" (US-10481106). https://patentable.app/patents/US-10481106","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10481106","json":"https://patentable.app/api/llm-context/US-10481106","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:59:51.101Z"}