{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10481109","patent":{"patent_number":"US-10481109","title":"Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique","assignee":null,"inventors":[],"filing_date":"2017-02-01T00:00:00.000Z","publication_date":"2019-11-19T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":10,"abstract":"A method for characterizing a sample combining an X-ray tomography characterization technique and a secondary ionization mass spectrometry characterization technique, includes: a step of providing a tip that includes first and second end surfaces, a first cylindrical region bearing the first end surface and a second region in contact with the first cylindrical region and becoming slimmer towards the second end surface; a step of machining the second region to obtain a sample holder including a flat surface, the flat surface forming an end surface of the sample holder, the area of the flat surface being less than the area of the first end surface; a step of placing the sample on the flat surface of the sample holder; a first step of characterization of the sample using an X-ray characterization technique; a second step of characterization of the sample using a secondary ionization mass spectrometry characterization technique."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique","description":"A method for characterizing a sample combining an X-ray tomography characterization technique and a secondary ionization mass spectrometry characterization technique, includes: a step of providing a t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10481109","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10481109","citation_suggestion":"Patentable. \"Method for characterizing a sample combining an X-ray characterization technique and a secondary ionization mass spectrometry characterization technique\" (US-10481109). https://patentable.app/patents/US-10481109","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10481109","json":"https://patentable.app/api/llm-context/US-10481109","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T03:14:17.739Z"}