{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10481592","patent":{"patent_number":"US-10481592","title":"Selecting manufacturing settings based on historical data from manufacturing tools","assignee":null,"inventors":[],"filing_date":"2017-10-27T00:00:00.000Z","publication_date":"2019-11-19T00:00:00.000Z","cpc_codes":["G05B","G05B","G05B","G05B"],"num_claims":14,"abstract":"Methods according to the disclosure include: identifying at least one non-candidate tool which previously processed at least one prior semiconductor wafer, and represented in a set of historical data, the set of historical data including manufacturing settings for performing an operation on the at least one prior semiconductor wafer, and a candidate tool which has not previously performed the operation on at least one prior semiconductor wafer, the candidate tool not being represented in the set of historical data; determining whether the set of historical data predicts the performing of the operation with the candidate tool based on the manufacturing settings for performing the operation on the at least one prior semiconductor wafer; and in response to the set of historical data predicting the performing of the operation with the candidate tool, selecting a manufacturing setting for the candidate tool based on the set of historical data."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Selecting manufacturing settings based on historical data from manufacturing tools","description":"Methods according to the disclosure include: identifying at least one non-candidate tool which previously processed at least one prior semiconductor wafer, and represented in a set of historical data,","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10481592","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10481592","citation_suggestion":"Patentable. \"Selecting manufacturing settings based on historical data from manufacturing tools\" (US-10481592). https://patentable.app/patents/US-10481592","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10481592","json":"https://patentable.app/api/llm-context/US-10481592","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T14:11:02.284Z"}