{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10483144","patent":{"patent_number":"US-10483144","title":"Method for determining front and back of single-crystal wafer","assignee":null,"inventors":[],"filing_date":"2016-08-18T00:00:00.000Z","publication_date":"2019-11-19T00:00:00.000Z","cpc_codes":["H01L","G01N","G01N","G01N"],"num_claims":12,"abstract":"A method for determining front and back of a single-crystal wafer including: using, as the single-crystal wafer, one having a crystal plane which is laterally asymmetrical to a reference direction connecting a center of a cut for orientation identification formed in an end face of the single-crystal wafer with a center of the single-crystal wafer; noticing the laterally asymmetrical crystal plane, applying an X-ray to the single-crystal wafer, and detecting a diffracted X-ray to measure an angle formed between an orientation of the noticed crystal plane and the reference direction; and determining whether a surface of the single-crystal wafer is a front surface or a back surface from a value of the measured angle. Consequently, the method for determining a front and a back of a single-crystal wafer which can assuredly determine the front and the back of the single-crystal wafer and is superior in cost can be provided."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for determining front and back of single-crystal wafer","description":"A method for determining front and back of a single-crystal wafer including: using, as the single-crystal wafer, one having a crystal plane which is laterally asymmetrical to a reference direction con","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10483144","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10483144","citation_suggestion":"Patentable. \"Method for determining front and back of single-crystal wafer\" (US-10483144). https://patentable.app/patents/US-10483144","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10483144","json":"https://patentable.app/api/llm-context/US-10483144","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T17:25:42.150Z"}