{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10489245","patent":{"patent_number":"US-10489245","title":"Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to short during testing and using on-the-fly bit failure detection and bit redundancy remapping techniques to correct them","assignee":null,"inventors":[],"filing_date":"2017-12-27T00:00:00.000Z","publication_date":"2019-11-26T00:00:00.000Z","cpc_codes":["G06F","G06F","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":20,"abstract":"A method for correcting bit defects in a memory array is disclosed. The method comprises determining, during a characterization stage, a resistance distribution for the memory array by classifying a state of each bit-cell in the memory array, wherein the memory array comprises a plurality of codewords, wherein each codeword comprises a plurality of redundant bits. Further, the method comprises determining bit-cells in the resistance distribution that are ambiguous, wherein ambiguous bit-cells have ambiguous resistances between being high or low bits. Subsequently, the method comprises forcing the ambiguous bit-cells to short circuits and replacing each short-circuited ambiguous bit-cell with a corresponding redundant bit from an associated codeword."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to short during testing and using on-the-fly bit failure detection and bit redundancy remapping techniques to correct them","description":"A method for correcting bit defects in a memory array is disclosed. The method comprises determining, during a characterization stage, a resistance distribution for the memory array by classifying a s","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10489245","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10489245","citation_suggestion":"Patentable. \"Forcing stuck bits, waterfall bits, shunt bits and low TMR bits to short during testing and using on-the-fly bit failure detection and bit redundancy remapping techniques to correct them\" (US-10489245). https://patentable.app/patents/US-10489245","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10489245","json":"https://patentable.app/api/llm-context/US-10489245","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T06:57:37.254Z"}