{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10489540","patent":{"patent_number":"US-10489540","title":"Integrating manufacturing feedback into integrated circuit structure design","assignee":null,"inventors":[],"filing_date":"2017-11-13T00:00:00.000Z","publication_date":"2019-11-26T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":18,"abstract":"Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield requirement for a first integrated circuit product; obtaining manufacturing data about the first integrated circuit product; performing a regression analysis on data representing paths in the first integrated circuit product to define a plurality of parameter settings based upon the acceptable yield requirement and the manufacturing data; determining a projection corner associated with the parameter settings for satisfying the acceptable yield requirement; and modifying a design of a second integrated circuit product based upon the projection corner and the plurality of parameter settings."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Integrating manufacturing feedback into integrated circuit structure design","description":"Solutions for integrating manufacturing feedback into an integrated circuit design are disclosed. In one embodiment, a computer-implemented method is disclosed including: defining an acceptable yield ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10489540","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10489540","citation_suggestion":"Patentable. \"Integrating manufacturing feedback into integrated circuit structure design\" (US-10489540). https://patentable.app/patents/US-10489540","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10489540","json":"https://patentable.app/api/llm-context/US-10489540","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:19:41.480Z"}