{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10490296","patent":{"patent_number":"US-10490296","title":"Memory built-in self-test (MBIST) test time reduction","assignee":null,"inventors":[],"filing_date":"2016-02-09T00:00:00.000Z","publication_date":"2019-11-26T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":20,"abstract":"Approaches for a memory built-in self-test (MBIST) are provided. The MBIST circuit includes a fail status register which receives a new fail signal value in response to a detection of a unique fail in a pattern, and a pattern mask register which stores at an end of the pattern a different value of the new fail signal value representative of the unique fail."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Memory built-in self-test (MBIST) test time reduction","description":"Approaches for a memory built-in self-test (MBIST) are provided. The MBIST circuit includes a fail status register which receives a new fail signal value in response to a detection of a unique fail in","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10490296","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10490296","citation_suggestion":"Patentable. \"Memory built-in self-test (MBIST) test time reduction\" (US-10490296). https://patentable.app/patents/US-10490296","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10490296","json":"https://patentable.app/api/llm-context/US-10490296","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:01:47.254Z"}