{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10495580","patent":{"patent_number":"US-10495580","title":"Inspection device, inspection system, and inspection method","assignee":null,"inventors":[],"filing_date":"2016-10-05T00:00:00.000Z","publication_date":"2019-12-03T00:00:00.000Z","cpc_codes":["G01N","C12Q","C12Q","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":8,"abstract":"An inspection device (1) inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (3), a pump unit (10) and an AC voltage supply unit (11). The dielectric collection unit includes at least one pair of electrodes (41, 42) and a flow channel (13) extending in a predetermined direction on the pair of electrodes. The pump unit is configured to feed the sample liquid to follow the flow channel in the predetermined direction. The AC voltage supply unit is configured to supply, to the pair of electrodes, an AC voltage with a predetermined frequency to cause dielectrophoresis for dielectric particles in the fed sample liquid. The dielectric collection unit includes a plurality of slit regions (Rs) aligned in the predetermined direction between the pair of electrodes. Each of the plurality of slit regions is separated from each other within the flow channel."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection device, inspection system, and inspection method","description":"An inspection device (1) inspects an amount of dielectric particles contained in a sample liquid. The inspection device includes a dielectric collection unit (3), a pump unit (10) and an AC voltage su","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10495580","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10495580","citation_suggestion":"Patentable. \"Inspection device, inspection system, and inspection method\" (US-10495580). https://patentable.app/patents/US-10495580","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10495580","json":"https://patentable.app/api/llm-context/US-10495580","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:35:44.476Z"}