{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10495584","patent":{"patent_number":"US-10495584","title":"Inspection apparatus and inspection method using the same","assignee":null,"inventors":[],"filing_date":"2017-09-13T00:00:00.000Z","publication_date":"2019-12-03T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":19,"abstract":"Disclosed herein is a method for inspecting a transparent film. The method comprises irradiating an inspection target with light using a polarizer, receiving light that is reflected by the inspection target and passes through an analyzer by a line scan camera, synthesizing an amplitude and a phase of wavelength of the light into an intensity of light, comparing the intensity of the light with predetermined intensities of light for inspection targets having different thicknesses; and detecting a defect of the inspection target based on the compared intensity with the predetermined intensities. It can be determined whether there is a transparent film, and the thickness of the transparent film can be measured in a large area. The inspection is carried out in real-time after the transparent film is formed, such that if a defect is generated, it can be fed back immediately to thereby reduce defects."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection apparatus and inspection method using the same","description":"Disclosed herein is a method for inspecting a transparent film. The method comprises irradiating an inspection target with light using a polarizer, receiving light that is reflected by the inspection ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10495584","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10495584","citation_suggestion":"Patentable. \"Inspection apparatus and inspection method using the same\" (US-10495584). https://patentable.app/patents/US-10495584","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10495584","json":"https://patentable.app/api/llm-context/US-10495584","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T08:37:02.466Z"}