{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10496506","patent":{"patent_number":"US-10496506","title":"Self-test capable integrated circuit apparatus and method of self-testing an integrated circuit","assignee":null,"inventors":[],"filing_date":"2017-11-17T00:00:00.000Z","publication_date":"2019-12-03T00:00:00.000Z","cpc_codes":["G06F","G06F","H01L","H01L"],"num_claims":20,"abstract":"A self-test capable integrated circuit apparatus includes a pattern generator, a results store and testable logic. The testable logic includes a plurality of scan channels, each of the channels being respectively coupled between the pattern generator and the results store. A self-test controller is arranged to supervise a self-test in respect of the testable logic to generate self-test result data, the self-test result data being stored in the results store. A processing resource is coupled to the self-test controller and coupled between the pattern generator and the results store, the processing resource being capable of evaluating the self-test result data stored in the results store. The testable logic includes the processing resource, arranged to cooperate with the self-test controller. The processing resource is able, subsequent to the self-test, to evaluate the self-test result data."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Self-test capable integrated circuit apparatus and method of self-testing an integrated circuit","description":"A self-test capable integrated circuit apparatus includes a pattern generator, a results store and testable logic. The testable logic includes a plurality of scan channels, each of the channels being ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10496506","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10496506","citation_suggestion":"Patentable. \"Self-test capable integrated circuit apparatus and method of self-testing an integrated circuit\" (US-10496506). https://patentable.app/patents/US-10496506","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10496506","json":"https://patentable.app/api/llm-context/US-10496506","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T11:56:48.724Z"}