{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10502701","patent":{"patent_number":"US-10502701","title":"Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process","assignee":null,"inventors":[],"filing_date":"2018-03-30T00:00:00.000Z","publication_date":"2019-12-10T00:00:00.000Z","cpc_codes":["G01N","B33Y","B33Y","B33Y","G01N","G01N","G01N"],"num_claims":19,"abstract":"An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process","description":"An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhol","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10502701","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10502701","citation_suggestion":"Patentable. \"Method and system using x-ray pinhole camera for in-situ monitoring of electron beam manufacturing process\" (US-10502701). https://patentable.app/patents/US-10502701","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10502701","json":"https://patentable.app/api/llm-context/US-10502701","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:58:54.923Z"}