{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10504806","patent":{"patent_number":"US-10504806","title":"Semiconductor package with electrical test pads","assignee":null,"inventors":[],"filing_date":"2016-05-06T00:00:00.000Z","publication_date":"2019-12-10T00:00:00.000Z","cpc_codes":["H01L","H01L","H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":11,"abstract":"One or more embodiments are directed to semiconductor packages that include conductive test pads that are electrically coupled to, but distinct from, the leads of the package. In one embodiment the test pads are located on the plastic packaging material, such as encapsulation material, of the package and are electrically coupled to the leads of the package by traces. The traces may also be located on the packaging material and portions of the leads. In one embodiment, all of the test pads are located on a single surface of the packaging material of the package, which may allow for ease of electrical testing of the package."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor package with electrical test pads","description":"One or more embodiments are directed to semiconductor packages that include conductive test pads that are electrically coupled to, but distinct from, the leads of the package. In one embodiment the te","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10504806","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10504806","citation_suggestion":"Patentable. \"Semiconductor package with electrical test pads\" (US-10504806). https://patentable.app/patents/US-10504806","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10504806","json":"https://patentable.app/api/llm-context/US-10504806","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:38:19.820Z"}