{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10514332","patent":{"patent_number":"US-10514332","title":"Systems and methods for providing a profile of a material property using multiple analysis stations","assignee":null,"inventors":[],"filing_date":"2017-12-13T00:00:00.000Z","publication_date":"2019-12-24T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N"],"num_claims":20,"abstract":"Systems and methods for profiling a material property are provided. A plurality of measurement devices can be configured to measure at least a portion of the material property. A controller including at least one processor can be in communication with one or more of the plurality of measurement devices. At least one measurement device of the plurality of measurement devices can measure at least one segment of the material property, and at least one additional measurement device of the plurality of measurement devices can measure at least one additional segment of the material property. The at least one segment and the at least one additional segment can be combined to provide at least a partial profile of the material property."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Systems and methods for providing a profile of a material property using multiple analysis stations","description":"Systems and methods for profiling a material property are provided. A plurality of measurement devices can be configured to measure at least a portion of the material property. A controller including ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10514332","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10514332","citation_suggestion":"Patentable. \"Systems and methods for providing a profile of a material property using multiple analysis stations\" (US-10514332). https://patentable.app/patents/US-10514332","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10514332","json":"https://patentable.app/api/llm-context/US-10514332","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T06:58:53.778Z"}