{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10514346","patent":{"patent_number":"US-10514346","title":"X-ray fluorescence spectrometer","assignee":null,"inventors":[],"filing_date":"2017-11-21T00:00:00.000Z","publication_date":"2019-12-24T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N"],"num_claims":8,"abstract":"Provided is an X-ray fluorescence spectrometer, which has a simple structure, and is capable of promptly performing high-accuracy analysis. The X-ray fluorescence spectrometer according to the present invention includes: an X-ray source (100) configured to irradiate a sample (103) with primary X-rays; a spectroscopic device (120) configured to disperse secondary X-rays emitted from the sample (103); an energy-dispersive detector (110) configured to measure an intensity of the secondary X-rays; a retracting mechanism (108) configured to retract the spectroscopic device (120) from a path of the secondary X-rays; a scanning mechanism (114), which is configured to continuously move the detector (110) between an auxiliary measurement area (124) for measuring the secondary X-rays in a state where the spectroscopic device (120) is retracted and a main measurement area (122) for measuring the dispersed secondary X-rays; a storage device (116) configured to store, in advance, a ratio between a background intensity measured in the auxiliary measurement area (124) and a background intensity measured in the main measurement area (122); and an arithmetic device (118) configured to perform correction and quantitative analysis, the correction including subtracting a value, which is obtained by multiplying the background intensity in the auxiliary measurement area (124) by the ratio, from a measured intensity in the main measurement area (122)."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"X-ray fluorescence spectrometer","description":"Provided is an X-ray fluorescence spectrometer, which has a simple structure, and is capable of promptly performing high-accuracy analysis. The X-ray fluorescence spectrometer according to the present","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10514346","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10514346","citation_suggestion":"Patentable. \"X-ray fluorescence spectrometer\" (US-10514346). https://patentable.app/patents/US-10514346","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10514346","json":"https://patentable.app/api/llm-context/US-10514346","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T00:36:20.519Z"}