{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10515444","patent":{"patent_number":"US-10515444","title":"Care area generation for inspecting integrated circuits","assignee":null,"inventors":[],"filing_date":"2017-01-30T00:00:00.000Z","publication_date":"2019-12-24T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T"],"num_claims":12,"abstract":"Methods and systems for inspecting integrated circuits are provided. The method includes generating care areas that each includes at least one potential defect, organizing the generated care areas based on a first set of spatial relationships to provide a list of neighboring care areas, wherein each neighboring care area is an entry within the list, and generating a recipe file of the list, wherein each neighboring care area is inspected sequentially using a high-resolution inspection system. The system comprises a memory including instructions executable by a processor to: generate care areas that each includes at least one potential defect, organize the generated care areas based on a first set of spatial relationships to provide a list of neighboring care areas that are each an entry within the list, and generate a recipe file of the list, wherein each neighboring care area is inspected sequentially using a high-resolution inspection system."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Care area generation for inspecting integrated circuits","description":"Methods and systems for inspecting integrated circuits are provided. The method includes generating care areas that each includes at least one potential defect, organizing the generated care areas bas","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10515444","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10515444","citation_suggestion":"Patentable. \"Care area generation for inspecting integrated circuits\" (US-10515444). https://patentable.app/patents/US-10515444","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10515444","json":"https://patentable.app/api/llm-context/US-10515444","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T01:16:04.204Z"}