{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10516790","patent":{"patent_number":"US-10516790","title":"Inspection apparatus, image forming system, inspection method, and program","assignee":null,"inventors":[],"filing_date":"2018-11-27T00:00:00.000Z","publication_date":"2019-12-24T00:00:00.000Z","cpc_codes":["H04N","H04N","H04N"],"num_claims":23,"abstract":"There is provided an inspection apparatus that inspects a printed material for a smudge, in accordance with an inspection image formed by reading a printed material, a print image being formed on the printed material, the inspection apparatus including: a hardware processor that: performs position adjustment between a reference image serving as an inspection standard for the print image, and the inspection image; detects a region presumed to be a smudge on the printed material as a smudge candidate region, in accordance with a difference image generated from the reference image and the inspection image after the position adjustment; and determines whether the smudge candidate region is a false smudge candidate region resulting from a positional shift of an object in the print image, in accordance with the smudge candidate region detected by the hardware processor and difference data characteristics of the difference image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection apparatus, image forming system, inspection method, and program","description":"There is provided an inspection apparatus that inspects a printed material for a smudge, in accordance with an inspection image formed by reading a printed material, a print image being formed on the ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10516790","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10516790","citation_suggestion":"Patentable. \"Inspection apparatus, image forming system, inspection method, and program\" (US-10516790). https://patentable.app/patents/US-10516790","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10516790","json":"https://patentable.app/api/llm-context/US-10516790","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T22:39:37.487Z"}