{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10520301","patent":{"patent_number":"US-10520301","title":"Method for measuring Z height values of a workpiece surface with a machine vision inspection system","assignee":null,"inventors":[],"filing_date":"2018-12-31T00:00:00.000Z","publication_date":"2019-12-31T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T","G06T","G06T"],"num_claims":20,"abstract":"A method for measuring Z height values of a workpiece surface with a machine vision inspection system comprises illuminating a workpiece surface with structured light, collecting at least two stacks of images of the workpiece, each stack including a different X-Y position between the structured light and the workpiece surface at a corresponding Z height in each of the stacks, and determining Z values based on sets of intensity values of a pixel corresponding to the same workpiece position in the X-Y plane which are at the same Z heights. The X-Y position is changed at a slower rate than the Z height in each stack of images, and is changed either continuously during each of the at least two stacks at a slower rate than the Z shift, or fixed to a different value during each of the at least two stacks."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for measuring Z height values of a workpiece surface with a machine vision inspection system","description":"A method for measuring Z height values of a workpiece surface with a machine vision inspection system comprises illuminating a workpiece surface with structured light, collecting at least two stacks o","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10520301","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10520301","citation_suggestion":"Patentable. \"Method for measuring Z height values of a workpiece surface with a machine vision inspection system\" (US-10520301). https://patentable.app/patents/US-10520301","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10520301","json":"https://patentable.app/api/llm-context/US-10520301","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:11:22.139Z"}