{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10528692","patent":{"patent_number":"US-10528692","title":"Cell-aware defect characterization for multibit cells","assignee":null,"inventors":[],"filing_date":"2018-10-31T00:00:00.000Z","publication_date":"2020-01-07T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":20,"abstract":"A cell-aware defect characterization method includes partitioning a multibit cell netlist file into multiple single-bit partition netlist files, and then generating a cell-aware test model for each partition netlist file. Partitioning is performed such that each partition netlist file includes a corresponding flip-flop along with input, output and control pins that are operably coupled to the input, output and control terminals of the corresponding flip-flop, and all active, passive and parasitic circuit elements that are coupled in the signal paths extending between the corresponding flip-flop and the input/output/control pins. Shared resources (e.g., clock or scan select pins and associated signal lines) that are utilized by two or more flip-flops are included in each associated partition. The partitioning process is performed using either a structural back-tracing approach or a logic simulation approach."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Cell-aware defect characterization for multibit cells","description":"A cell-aware defect characterization method includes partitioning a multibit cell netlist file into multiple single-bit partition netlist files, and then generating a cell-aware test model for each pa","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10528692","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10528692","citation_suggestion":"Patentable. \"Cell-aware defect characterization for multibit cells\" (US-10528692). https://patentable.app/patents/US-10528692","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10528692","json":"https://patentable.app/api/llm-context/US-10528692","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:38:26.970Z"}