{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10530324","patent":{"patent_number":"US-10530324","title":"On-die resistor measurement","assignee":null,"inventors":[],"filing_date":"2018-08-21T00:00:00.000Z","publication_date":"2020-01-07T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C","G11C","H01L","H01L","G11C","G11C","G11C","G11C","G11C","H01L","H01L","H01L","H01L","H01L","H01L","H01L"],"num_claims":20,"abstract":"Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bump) can be used to sweep a voltage across the on-die resistor. The testing system identifies when the voltage across the on-die resistor reaches a predefined reference voltage and measures the corresponding current. Using the measured current and the reference voltage, the testing system can identify the actual resistance of the on-die resistor. In one embodiment, the on-die resistor is tunable such if the on-die resistor has a divergent value, the die can adjust its resistance value to the desired value."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"On-die resistor measurement","description":"Examples herein describe a die that includes a testing system (e.g., testing circuitry) for measuring the actual resistance of on-die resistors. When testing the die, an I/O element (e.g., a solder bu","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10530324","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10530324","citation_suggestion":"Patentable. \"On-die resistor measurement\" (US-10530324). https://patentable.app/patents/US-10530324","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10530324","json":"https://patentable.app/api/llm-context/US-10530324","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T10:39:32.777Z"}