{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10533845","patent":{"patent_number":"US-10533845","title":"Measuring device, measuring method, system and manufacturing method","assignee":null,"inventors":[],"filing_date":"2016-09-19T00:00:00.000Z","publication_date":"2020-01-14T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T"],"num_claims":9,"abstract":"A measuring device for measuring an object includes a controller, a projector, an imaging unit, and a processor, the controller controls the projector and the imaging unit to start projection and imaging in a second condition after starting projection and imaging in a first condition, and to start imaging in the second condition with a time interval of an integer multiple of a period of intensity of light other than a pattern of light from an imaging start time in the first condition, and the processor obtains intersection point positions of gradation values between image data obtained at the same imaging time in each condition among image data obtained at each imaging time in the first condition and image data obtained at each imaging time in the second condition, and calculates the shape information based on the obtained intersection point positions."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Measuring device, measuring method, system and manufacturing method","description":"A measuring device for measuring an object includes a controller, a projector, an imaging unit, and a processor, the controller controls the projector and the imaging unit to start projection and imag","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10533845","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10533845","citation_suggestion":"Patentable. \"Measuring device, measuring method, system and manufacturing method\" (US-10533845). https://patentable.app/patents/US-10533845","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10533845","json":"https://patentable.app/api/llm-context/US-10533845","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T08:26:43.777Z"}