{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10533931","patent":{"patent_number":"US-10533931","title":"Method and examination system for examining and processing a microscopic sample","assignee":null,"inventors":[],"filing_date":"2016-05-20T00:00:00.000Z","publication_date":"2020-01-14T00:00:00.000Z","cpc_codes":["G01N","G01N","G06T","G01N","G01N","G06T","G06T"],"num_claims":18,"abstract":"A method for examining and processing a microscopic sample arranged on a slide includes producing reference markings on the slide by a laser beam of a laser microdissection system. A digital image of the sample and the reference markings on the slide is produced by a digital optical imaging device. An image region is defined and first position information data which indicate a position of the image region is generated. The reference markings are identified in the image and second position information data which indicate a position of the reference markings in the image is generated. The reference markings are identified, and third position information data which indicate the position of the reference markings in the laser microdissection system is generated. The first, second and third position information data are correlated and a sample region which corresponds to the image region is processed."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method and examination system for examining and processing a microscopic sample","description":"A method for examining and processing a microscopic sample arranged on a slide includes producing reference markings on the slide by a laser beam of a laser microdissection system. A digital image of ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10533931","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10533931","citation_suggestion":"Patentable. \"Method and examination system for examining and processing a microscopic sample\" (US-10533931). https://patentable.app/patents/US-10533931","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10533931","json":"https://patentable.app/api/llm-context/US-10533931","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T10:03:49.409Z"}