{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10534018","patent":{"patent_number":"US-10534018","title":"Time base correction method for high accuracy sampling scope-based measurements","assignee":null,"inventors":[],"filing_date":"2019-01-16T00:00:00.000Z","publication_date":"2020-01-14T00:00:00.000Z","cpc_codes":["H04B"],"num_claims":11,"abstract":"A method and apparatus for resolving time base-generated errors from sampling scope-based measurements. Mutually synchronized repetitive waveform-to-be-analyzed signals (WAS) and repetitive sinusoidal reference signals (RS) are respectively applied to a first channel and a second channel of a sampling scope. A time base generator applies a sampling signal to the first and second channels. An average sine wave period Tav for k samples of RS is determined, followed by determination of phase error φk for each of the k samples, corresponding to phase differences between an ideal sine wave signal and the applied reference sinusoidal signal. Time base error values dk for k samples are calculated from dk=φk*Tav/2π. Error values dk correct time base errors in the sampling signal, and the WAS is re-sampled at sampling times adjusted by dk."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Time base correction method for high accuracy sampling scope-based measurements","description":"A method and apparatus for resolving time base-generated errors from sampling scope-based measurements. Mutually synchronized repetitive waveform-to-be-analyzed signals (WAS) and repetitive sinusoidal","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10534018","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10534018","citation_suggestion":"Patentable. \"Time base correction method for high accuracy sampling scope-based measurements\" (US-10534018). https://patentable.app/patents/US-10534018","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10534018","json":"https://patentable.app/api/llm-context/US-10534018","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:11:02.827Z"}