{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10539583","patent":{"patent_number":"US-10539583","title":"Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system","assignee":null,"inventors":[],"filing_date":"2015-12-11T00:00:00.000Z","publication_date":"2020-01-21T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G01N","G01N","G01N","G01N","G01N"],"num_claims":22,"abstract":"A substrate for sample analysis including: a substrate including a rotation axis; a first chamber, which includes a first space which retains the liquid; a second chamber, which includes a second space which retains the liquid discharged from the first chamber; and a first flow passage, which includes a path connecting the first chamber and the second chamber in which the first flow passage has a first opening and a second opening, the first opening and the second opening are connected to the first chamber and the second chamber, respectively, and the first opening is positioned on a side closer to the rotation axis than the second opening, in which the first space includes a first region, which includes a portion extending from the first opening and in which the first space of the first chamber has a capacity larger than a capacity of the first flow passage."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system","description":"A substrate for sample analysis including: a substrate including a rotation axis; a first chamber, which includes a first space which retains the liquid; a second chamber, which includes a second spac","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10539583","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10539583","citation_suggestion":"Patentable. \"Substrate for sample analysis, sample analysis device, sample analysis system, and program for sample analysis system\" (US-10539583). https://patentable.app/patents/US-10539583","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10539583","json":"https://patentable.app/api/llm-context/US-10539583","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:16:36.219Z"}