{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-10539607","patent":{"patent_number":"US-10539607","title":"Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon","assignee":null,"inventors":[],"filing_date":"2017-05-08T00:00:00.000Z","publication_date":"2020-01-21T00:00:00.000Z","cpc_codes":["H01L","H01L"],"num_claims":18,"abstract":"An evaluation apparatus includes an insulating plate, a plurality of probes fixed to the insulating plate, an insulating portion having a connection portion connected to the insulating plate in a detachable manner and a tip portion continuous with the connection portion, the tip portion being narrower than the connection portion, an insulator formed by combining the insulating portions to surround the plurality of probes in planar view, and an evaluation unit for passing currents through the plurality of probes to evaluate electrical characteristics of an object to be measured."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon","description":"An evaluation apparatus includes an insulating plate, a plurality of probes fixed to the insulating plate, an insulating portion having a connection portion connected to the insulating plate in a deta","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-10539607","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-10539607","citation_suggestion":"Patentable. \"Evaluation apparatus including a plurality of insulating portions surrounding a probe and semiconductor device evaluation method based thereon\" (US-10539607). https://patentable.app/patents/US-10539607","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-10539607","json":"https://patentable.app/api/llm-context/US-10539607","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:47:12.998Z"}