{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11233693","patent":{"patent_number":"US-11233693","title":"Learning based incident or defect resolution, and test generation","assignee":null,"inventors":[],"filing_date":"2020-07-10T00:00:00.000Z","publication_date":"2022-01-25T00:00:00.000Z","cpc_codes":["H04L","G06F","G06F","G06F","G06F","G06F","G06N","H04L","H04L","H04L","G06N","H04L","H04L"],"num_claims":20,"abstract":"In some examples, learning based incident or defect resolution, and test generation may include ascertaining historical log data that includes incident or defect log data associated with operation of a process, and generating, based on the historical log data, step action graphs. Based on grouping of the step action graphs with respect to different incident and defect tickets, an incident and defect action graph may be generated to further generate a machine learning model. Based on an analysis of the machine learning model with respect to a new incident or defect, an output that includes a sequence of actions may be generated to reproduce, for the new incident, steps that result in the new incident, reproduce, for the new defect, an error that results in the new defect, identify a root cause of the new incident or defect, and/or resolve the new incident or defect."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Learning based incident or defect resolution, and test generation","description":"In some examples, learning based incident or defect resolution, and test generation may include ascertaining historical log data that includes incident or defect log data associated with operation of ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11233693","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11233693","citation_suggestion":"Patentable. \"Learning based incident or defect resolution, and test generation\" (US-11233693). https://patentable.app/patents/US-11233693","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11233693","json":"https://patentable.app/api/llm-context/US-11233693","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T17:06:35.623Z"}