{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11237224","patent":{"patent_number":"US-11237224","title":"Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same","assignee":null,"inventors":[],"filing_date":"2019-10-03T00:00:00.000Z","publication_date":"2022-02-01T00:00:00.000Z","cpc_codes":["H01L","H01L"],"num_claims":9,"abstract":"A magnetic property measuring system may include a stage configured to load a sample and to rotate the sample about a rotation axis such that the stage rotates the sample by a rotation angle, the rotation axis extending normal to a top surface of the sample. The magnetic property measuring system may further include a polarizer having a first polarization axis, and an analyzer having a second polarization axis. The polarizer and the analyzer may enable the first and second polarization axes to be independently rotated based on the rotation angle of the sample."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same","description":"A magnetic property measuring system may include a stage configured to load a sample and to rotate the sample about a rotation axis such that the stage rotates the sample by a rotation angle, the rota","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11237224","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11237224","citation_suggestion":"Patentable. \"Magnetic property measuring systems, methods of measuring magnetic property, and methods of fabricating magnetic memory devices using the same\" (US-11237224). https://patentable.app/patents/US-11237224","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11237224","json":"https://patentable.app/api/llm-context/US-11237224","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:34:06.232Z"}