{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11238579","patent":{"patent_number":"US-11238579","title":"Defect pattern grouping method and system","assignee":null,"inventors":[],"filing_date":"2018-01-18T00:00:00.000Z","publication_date":"2022-02-01T00:00:00.000Z","cpc_codes":["G06T","G05B","G05B","G06T"],"num_claims":18,"abstract":"A defect pattern grouping method is disclosed. The defect pattern grouping method comprises obtaining a first polygon that represents a first defect from an image of a sample, comparing the first polygon with a set of one or more representative polygons of a defect-pattern collection, and grouping the first polygon with any one or more representative polygons identified based on the comparison."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect pattern grouping method and system","description":"A defect pattern grouping method is disclosed. The defect pattern grouping method comprises obtaining a first polygon that represents a first defect from an image of a sample, comparing the first poly","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11238579","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11238579","citation_suggestion":"Patentable. \"Defect pattern grouping method and system\" (US-11238579). https://patentable.app/patents/US-11238579","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11238579","json":"https://patentable.app/api/llm-context/US-11238579","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T09:40:00.077Z"}