{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11240778","patent":{"patent_number":"US-11240778","title":"Configurable quality metric for positioning measurements","assignee":null,"inventors":[],"filing_date":"2020-06-12T00:00:00.000Z","publication_date":"2022-02-01T00:00:00.000Z","cpc_codes":["H04L","H04W","G01S","G01S","G01S","G01S","H04L","H04W","H04W","G01S","G01S","H04L","H04L","H04L","H04L"],"num_claims":30,"abstract":"Disclosed are techniques for wireless communication. In an aspect, a network node performs one or more positioning measurements of one or more types of positioning measurements of one or more reference signals, and reports, to a positioning entity, the one or more positioning measurements and one or more measurement quality values representing a measurement quality of the one or more positioning measurements, the one or more measurement quality values based on measurement quality reporting parameters, wherein the measurement quality reporting parameters comprise a minimum error value, a maximum error value, a number of bits used for the one or more measurement quality values, a scaling function or an identifier of the scaling function, or any combination thereof."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Configurable quality metric for positioning measurements","description":"Disclosed are techniques for wireless communication. In an aspect, a network node performs one or more positioning measurements of one or more types of positioning measurements of one or more referenc","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11240778","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11240778","citation_suggestion":"Patentable. \"Configurable quality metric for positioning measurements\" (US-11240778). https://patentable.app/patents/US-11240778","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11240778","json":"https://patentable.app/api/llm-context/US-11240778","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T05:10:43.377Z"}