{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11244842","patent":{"patent_number":"US-11244842","title":"Processing apparatus for detecting defects inside electronic component including illumination portion and imaging portion","assignee":null,"inventors":[],"filing_date":"2020-12-16T00:00:00.000Z","publication_date":"2022-02-08T00:00:00.000Z","cpc_codes":["G01N","H01L","G01N","G06T","H04N","G01N","G01N","G06T","H04N"],"num_claims":4,"abstract":"An processing apparatus includes a first illumination portion and a first imaging portion. The first illumination portion irradiates ta second inner surface on an opposite side of a second outer surface and a third inner surface on an opposite side of a third outer surface via a first outer surface of the electronic component with irradiation light in a state where the electronic component is disposed on a first inspection position. The first imaging portion captures an image of a first internal corner portion formed by the second inner surface and the third inner surface, based on the first irradiation light emitted from the first outer surface after being specularly reflected on the second inner surface and the third inner surface."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Processing apparatus for detecting defects inside electronic component including illumination portion and imaging portion","description":"An processing apparatus includes a first illumination portion and a first imaging portion. The first illumination portion irradiates ta second inner surface on an opposite side of a second outer surfa","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11244842","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11244842","citation_suggestion":"Patentable. \"Processing apparatus for detecting defects inside electronic component including illumination portion and imaging portion\" (US-11244842). https://patentable.app/patents/US-11244842","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11244842","json":"https://patentable.app/api/llm-context/US-11244842","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T13:16:12.488Z"}