{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11249031","patent":{"patent_number":"US-11249031","title":"Inspection system and method for analysing defects","assignee":null,"inventors":[],"filing_date":"2018-10-25T00:00:00.000Z","publication_date":"2022-02-15T00:00:00.000Z","cpc_codes":["G01N","G01N","G01N","G06T","G06T","G06T","G06T","G01N","G06T","G06T"],"num_claims":22,"abstract":"The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (24), wherein the inspection system comprises a detection unit (26), a conveyance device (27) and a processing device, wherein the detection unit includes an optical detecting device (31), wherein the conveyance device is used to continuously transport a plurality of transformer laminations (25) relative to the detecting device, wherein the detecting device is arranged transversely, preferably orthogonally, to a direction of movement of a transformer lamination, wherein a velocity of movement of a transformer lamination relative to the detecting device is measured via a measurement device (40) of the detection unit, wherein an image of a contour of a transformer lamination is captured with the detecting device, wherein images of a transformer lamination are assembled into a combined image of the transformer lamination via the processing device while considering the velocity of movement of the transformer lamination, wherein a shape of the transformer lamination is determined on the basis of the combined image via the processing device."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Inspection system and method for analysing defects","description":"The invention relates to a method for analysing defects in transformer laminations using an inspection system, and to an inspection system (24), wherein the inspection system comprises a detection uni","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11249031","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11249031","citation_suggestion":"Patentable. \"Inspection system and method for analysing defects\" (US-11249031). https://patentable.app/patents/US-11249031","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11249031","json":"https://patentable.app/api/llm-context/US-11249031","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T14:46:27.413Z"}