{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11255655","patent":{"patent_number":"US-11255655","title":"Differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method","assignee":null,"inventors":[],"filing_date":"2019-09-04T00:00:00.000Z","publication_date":"2022-02-22T00:00:00.000Z","cpc_codes":["G01D"],"num_claims":5,"abstract":"The disclosure discloses a differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method. The beam output from the single-frequency laser is converted into a 45° linearly polarized beam after passing through the polarizer, then projected onto two sets of sinusoidal phase modulation interferometers consisting of the beam splitter, the electro-optic phase modulator, the half wave plate, three pyramid prisms, two polarization beam splitters, thereby forming measurement and reference interference signals which are received by two photodetectors. A high-frequency sinusoidal voltage signal is applied to the electro-optic phase modulator placed in the common reference arm of the two interferometers, thereby modulating the interference signal into a high-frequency AC signal. By detecting the difference between the phase change amounts of the two interference signals when the measured object moves, the measured displacement can be obtained."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method","description":"The disclosure discloses a differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method. The beam output from the single-frequency laser is conv","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11255655","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11255655","citation_suggestion":"Patentable. \"Differential sinusoidal phase modulation laser interferometric nanometer displacement measuring apparatus and method\" (US-11255655). https://patentable.app/patents/US-11255655","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11255655","json":"https://patentable.app/api/llm-context/US-11255655","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T19:52:15.155Z"}