{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11256610","patent":{"patent_number":"US-11256610","title":"Methods and systems for generating a combined metric parameter for A/B testing","assignee":null,"inventors":[],"filing_date":"2020-07-14T00:00:00.000Z","publication_date":"2022-02-22T00:00:00.000Z","cpc_codes":["G06F","G06F","G06F","G06F"],"num_claims":20,"abstract":"Methods and systems for generating a combined metric parameter for A/B testing comprising: acquiring a respective first metric parameter for a first and second plurality of feature vectors, a combination of the respective first metric parameters being indicative of a direction of a change in user interactions between the control version and the treatment version, acquiring a respective second metric parameter for the first and second plurality of feature vectors, a combination of the respective second metric parameters being indicative of a magnitude of the change in user interactions between the control and treatment version, generating a respective combined control metric parameter for the first plurality of feature vectors and the second plurality of feature vectors, the combination of the respective combined metric parameters being simultaneously indicative of the magnitude and the direction of the change in user interactions between the control and treatment version."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods and systems for generating a combined metric parameter for A/B testing","description":"Methods and systems for generating a combined metric parameter for A/B testing comprising: acquiring a respective first metric parameter for a first and second plurality of feature vectors, a combinat","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11256610","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11256610","citation_suggestion":"Patentable. \"Methods and systems for generating a combined metric parameter for A/B testing\" (US-11256610). https://patentable.app/patents/US-11256610","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11256610","json":"https://patentable.app/api/llm-context/US-11256610","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T15:56:40.160Z"}