{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11257564","patent":{"patent_number":"US-11257564","title":"Defect detection for a memory device","assignee":null,"inventors":[],"filing_date":"2020-11-04T00:00:00.000Z","publication_date":"2022-02-22T00:00:00.000Z","cpc_codes":["G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C","G11C"],"num_claims":24,"abstract":"Methods, systems, and devices for defect detection for a memory device are described. A segmented digital die defect detector may include multiple signal lines, each coupled with a test circuit, and a control circuit to form a path. At least part of the path may extend through an internal portion of the die. A test circuit may generate a digital feedback signal that indicates a condition of a respective signal line. The control circuit may generate a single output signal, indicative of the condition of the signal lines. By utilizing digital testing circuitry and a single digital output signal, a layout area of the segmented digital die defect detector may be reduced and a power consumption associated with the testing operation may be reduced."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect detection for a memory device","description":"Methods, systems, and devices for defect detection for a memory device are described. A segmented digital die defect detector may include multiple signal lines, each coupled with a test circuit, and a","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11257564","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11257564","citation_suggestion":"Patentable. \"Defect detection for a memory device\" (US-11257564). https://patentable.app/patents/US-11257564","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11257564","json":"https://patentable.app/api/llm-context/US-11257564","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T05:55:51.917Z"}