{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11268917","patent":{"patent_number":"US-11268917","title":"X-ray inspection apparatus","assignee":null,"inventors":[],"filing_date":"2018-05-21T00:00:00.000Z","publication_date":"2022-03-08T00:00:00.000Z","cpc_codes":["G01N","G06T","G01N","G01N"],"num_claims":4,"abstract":"Utilizing random variation (repeated positioning error) when reciprocating operation is repeatedly performed in which a stage is moved by (+x, +y) pulses toward an arbitrary position perpendicular to an optical axis of X-rays extending from an X-ray source to an X-ray detector, and then, is moved from there by (−x, −y) pulses, an image group of images obtained by moving in parallel to each other is acquired, and an image processing unit finds a deviation between the images, and acquires an input image group in which each of the images has the deviation at a subpixel level. The image processing unit executes a reconstruction processing, using the input image group in which each of the images has the deviation at the subpixel level to generate a super-resolution image."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"X-ray inspection apparatus","description":"Utilizing random variation (repeated positioning error) when reciprocating operation is repeatedly performed in which a stage is moved by (+x, +y) pulses toward an arbitrary position perpendicular to ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11268917","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11268917","citation_suggestion":"Patentable. \"X-ray inspection apparatus\" (US-11268917). https://patentable.app/patents/US-11268917","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11268917","json":"https://patentable.app/api/llm-context/US-11268917","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T09:42:12.730Z"}