{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11270426","patent":{"patent_number":"US-11270426","title":"Computer aided inspection system and methods","assignee":null,"inventors":[],"filing_date":"2019-05-14T00:00:00.000Z","publication_date":"2022-03-08T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T","G06T"],"num_claims":15,"abstract":"Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured to determine real-world global localization information of a user in relation to a structure being inspected using information obtained from a first sensor package, a model alignment system configured to: use the determined global localization information to index into a corresponding location in a 3D computer model of the structure being inspected; and align observations and/or information obtained from the first sensor package to the local area of the model 3D computer model of the structure extracted; a second sensor package configured to obtain fine level measurements of the structure; and a model recognition system configured to compare the fine level measurements and information obtained about the structure from the second sensor package to the 3D computer model."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Computer aided inspection system and methods","description":"Computer aided inspection systems (CAIS) and method for inspection, error analysis and comparison of structures are presented herein. In some embodiments, a CAIS may include a SLAM system configured t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11270426","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11270426","citation_suggestion":"Patentable. \"Computer aided inspection system and methods\" (US-11270426). https://patentable.app/patents/US-11270426","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11270426","json":"https://patentable.app/api/llm-context/US-11270426","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T11:55:34.568Z"}