{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11270430","patent":{"patent_number":"US-11270430","title":"Wafer inspection using difference images","assignee":null,"inventors":[],"filing_date":"2018-05-04T00:00:00.000Z","publication_date":"2022-03-08T00:00:00.000Z","cpc_codes":["G06T","G06T","G06T","G06T","G06T"],"num_claims":18,"abstract":"Systems and methods increase the signal to noise ratio of optical inspection of wafers to obtain higher inspection sensitivity. The computed reference image can minimize a norm of the difference of the test image and the computed reference image. A difference image between the test image and a computed reference image is determined. The computed reference image includes a linear combination of a second set of images."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Wafer inspection using difference images","description":"Systems and methods increase the signal to noise ratio of optical inspection of wafers to obtain higher inspection sensitivity. The computed reference image can minimize a norm of the difference of th","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11270430","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11270430","citation_suggestion":"Patentable. \"Wafer inspection using difference images\" (US-11270430). https://patentable.app/patents/US-11270430","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11270430","json":"https://patentable.app/api/llm-context/US-11270430","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T08:27:48.813Z"}