{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11270949","patent":{"patent_number":"US-11270949","title":"Substrate and method for monitoring positions of boundaries of film layer on the substrate","assignee":null,"inventors":[],"filing_date":"2019-12-19T00:00:00.000Z","publication_date":"2022-03-08T00:00:00.000Z","cpc_codes":["H01L","G02F","G02F","H01L"],"num_claims":13,"abstract":"The present invention provides a substrate and a method for monitoring positions of boundaries of a film layer disposed on a substrate. A plurality of sets of positioning units are provided in a non-display region of the substrate. Each set of the positioning units includes at least two primary positioning marks and corresponding primary positioning rulers. There are at least two secondary positioning marks and corresponding secondary positioning rulers disposed between the two adjacent primary positioning marks. The present invention determines a specific position of the boundaries of the film layer according to readings of the positioning rulers of the plurality of sets of positioning units corresponding to the boundaries of the film layer."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Substrate and method for monitoring positions of boundaries of film layer on the substrate","description":"The present invention provides a substrate and a method for monitoring positions of boundaries of a film layer disposed on a substrate. A plurality of sets of positioning units are provided in a non-d","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11270949","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11270949","citation_suggestion":"Patentable. \"Substrate and method for monitoring positions of boundaries of film layer on the substrate\" (US-11270949). https://patentable.app/patents/US-11270949","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11270949","json":"https://patentable.app/api/llm-context/US-11270949","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T20:30:37.925Z"}