{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11270957","patent":{"patent_number":"US-11270957","title":"Method for detecting a breach of the integrity of a semiconductor substrate of an integrated circuit from its rear face, and corresponding device","assignee":null,"inventors":[],"filing_date":"2019-02-05T00:00:00.000Z","publication_date":"2022-03-08T00:00:00.000Z","cpc_codes":["H01L","G06F","G06F","G06K","H01L"],"num_claims":17,"abstract":"A semiconductor substrate of an integrated circuit is protected by a coating. The semiconductor includes a front face and a rear face. To detect a breach of the integrity of a semiconductor substrate of an integrated circuit from the rear face, an opening of the coating facing the rear face of the substrate is detected. In response thereto, an alarm is generated. The detection is performed by making resistance measurements with respect to the semiconductor substrate and comparing the measured resistance to a nominal resistive value of the semiconductor substrate."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Method for detecting a breach of the integrity of a semiconductor substrate of an integrated circuit from its rear face, and corresponding device","description":"A semiconductor substrate of an integrated circuit is protected by a coating. The semiconductor includes a front face and a rear face. To detect a breach of the integrity of a semiconductor substrate ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11270957","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11270957","citation_suggestion":"Patentable. \"Method for detecting a breach of the integrity of a semiconductor substrate of an integrated circuit from its rear face, and corresponding device\" (US-11270957). https://patentable.app/patents/US-11270957","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11270957","json":"https://patentable.app/api/llm-context/US-11270957","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T12:37:01.481Z"}