{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11275362","patent":{"patent_number":"US-11275362","title":"Test time reduction for manufacturing processes by substituting a test parameter","assignee":null,"inventors":[],"filing_date":"2019-06-06T00:00:00.000Z","publication_date":"2022-03-15T00:00:00.000Z","cpc_codes":["G05B","G06F","G06F","G06F","G06F","G06N","G06N","G06N","G06V"],"num_claims":20,"abstract":"Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. The electronic processor is also configured to determine a first set of testing parameters from the plurality of testing parameters to remove for the assembly line based on the training data and determine a second set of testing parameters to keep by removing the first set of testing parameters from the plurality of testing parameters. The electronic processor is also configured to determine a predictive model to replace the first set of testing parameters based on the training data associated with the second set of testing parameters, and automatically update a testing process for the assembly line to turn off the first set of testing parameters and use the predictive model in place of the first set of testing parameters."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Test time reduction for manufacturing processes by substituting a test parameter","description":"Methods and systems of identifying a time reduction in a manufacturing time associated with a plurality of products. One system includes an electronic processor configured to receive training data. Th","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11275362","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11275362","citation_suggestion":"Patentable. \"Test time reduction for manufacturing processes by substituting a test parameter\" (US-11275362). https://patentable.app/patents/US-11275362","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11275362","json":"https://patentable.app/api/llm-context/US-11275362","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T08:26:19.683Z"}