{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11276250","patent":{"patent_number":"US-11276250","title":"Recognition for overlapped patterns","assignee":null,"inventors":[],"filing_date":"2019-10-23T00:00:00.000Z","publication_date":"2022-03-15T00:00:00.000Z","cpc_codes":["G06V","G06V","G06V","G06V"],"num_claims":17,"abstract":"In an approach, data of a plurality of points is sampled in a target area, wherein the data of each point of the plurality of points comprises position information and a height value. A first area of a target area is determined, wherein the height value of each point of the plurality of points in the first area complies with a first range. A second area of the target area is determined, wherein the height value of each point of the plurality of points in the second area complies with a second range. A third area of the target area is determined, wherein the height value of each point of the plurality of points in the third area complies with a third range. A first pattern is generated, wherein the first pattern is a combination of the first area and the third area."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Recognition for overlapped patterns","description":"In an approach, data of a plurality of points is sampled in a target area, wherein the data of each point of the plurality of points comprises position information and a height value. A first area of ","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11276250","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11276250","citation_suggestion":"Patentable. \"Recognition for overlapped patterns\" (US-11276250). https://patentable.app/patents/US-11276250","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11276250","json":"https://patentable.app/api/llm-context/US-11276250","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T23:55:51.609Z"}