{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11280831","patent":{"patent_number":"US-11280831","title":"Semiconductor integrated circuit with self testing and method of testing","assignee":null,"inventors":[],"filing_date":"2020-02-25T00:00:00.000Z","publication_date":"2022-03-22T00:00:00.000Z","cpc_codes":["G06F"],"num_claims":19,"abstract":"According to one embodiment, a semiconductor integrated circuit includes: a first core that includes a first logic circuit that has a plurality of first scan chains, and a first generator that generates a first test pattern; a second core that includes a second logic circuit that has a plurality of second scan chains, and a second generator that generates a second test pattern; a controller that controls a test operation of the first and second cores. The controller is configured to: obtain a seed for a test pattern from the first generator; supply the obtained seed to the second generator; perform a test on the first and second cores for a same number of cycles; obtain first and second test results respectively from the first and second cores; and compare the first and second test results."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Semiconductor integrated circuit with self testing and method of testing","description":"According to one embodiment, a semiconductor integrated circuit includes: a first core that includes a first logic circuit that has a plurality of first scan chains, and a first generator that generat","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11280831","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11280831","citation_suggestion":"Patentable. \"Semiconductor integrated circuit with self testing and method of testing\" (US-11280831). https://patentable.app/patents/US-11280831","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11280831","json":"https://patentable.app/api/llm-context/US-11280831","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T08:28:16.103Z"}