{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11282181","patent":{"patent_number":"US-11282181","title":"Methods of yield assessment with crop photometry","assignee":null,"inventors":[],"filing_date":"2020-07-02T00:00:00.000Z","publication_date":"2022-03-22T00:00:00.000Z","cpc_codes":["G06V","G06T","G06T","G06T","G06T","G06V","H04N","G06T","G06T","G06T","G06T","G06T","G06V"],"num_claims":17,"abstract":"A method of evaluating one or more kernels of an ear of maize using digital imagery that includes acquiring a digital image of the one or more kernels of the ear of maize without the use of spatial reference points, processing the digital image to estimate at least one physical property of the one or more kernels of the ear of maize from the digital image, and evaluating the at least one kernel of maize using the estimate of the at least one physical property of the at least one kernel of maize. The method includes using one or more such digital images to estimate yield on a plant, management zone, field, county and country level."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Methods of yield assessment with crop photometry","description":"A method of evaluating one or more kernels of an ear of maize using digital imagery that includes acquiring a digital image of the one or more kernels of the ear of maize without the use of spatial re","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11282181","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11282181","citation_suggestion":"Patentable. \"Methods of yield assessment with crop photometry\" (US-11282181). https://patentable.app/patents/US-11282181","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11282181","json":"https://patentable.app/api/llm-context/US-11282181","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T16:18:40.826Z"}