{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11287366","patent":{"patent_number":"US-11287366","title":"Scanning microwave ellipsometer and performing scanning microwave ellipsometry","assignee":null,"inventors":[],"filing_date":"2020-05-01T00:00:00.000Z","publication_date":"2022-03-29T00:00:00.000Z","cpc_codes":["G01N","G01N"],"num_claims":19,"abstract":"A scanning microwave ellipsometer includes: a microwave ellipsometry test head including: a polarization controller; a transmission line; and a sensor that produces sensor microwave radiation, subjects a sample to the sensor microwave radiation, receives a sample reflected microwave radiation from the sample that results from subjecting the sample with the sample reflected microwave radiation, and produces a sensor-received microwave radiation from the sample reflected microwave radiation, wherein a polarization of the sensor microwave radiation is controlled by the polarization controller; an electrical signal measurement system that produces an electrical readout signal such that a magnitude of reflection coefficient Γ and an angle of reflection coefficient Γ of the sample reflected microwave radiation is determined from the electrical readout signal; and a position controller that adjusts a relative position of the sensor and the sample."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Scanning microwave ellipsometer and performing scanning microwave ellipsometry","description":"A scanning microwave ellipsometer includes: a microwave ellipsometry test head including: a polarization controller; a transmission line; and a sensor that produces sensor microwave radiation, subject","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11287366","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11287366","citation_suggestion":"Patentable. \"Scanning microwave ellipsometer and performing scanning microwave ellipsometry\" (US-11287366). https://patentable.app/patents/US-11287366","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11287366","json":"https://patentable.app/api/llm-context/US-11287366","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T22:54:19.287Z"}