{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11287807","patent":{"patent_number":"US-11287807","title":"Defect detection during an automated production process","assignee":null,"inventors":[],"filing_date":"2019-05-22T00:00:00.000Z","publication_date":"2022-03-29T00:00:00.000Z","cpc_codes":["G05B","G05B","G05B","G05B","G05B","G05B","G05B"],"num_claims":20,"abstract":"Described herein are improvements for identifying defects during automated item production. In one example, a method includes identifying a first defect in a first item. The first defect is associated with a stage of production of the first produced item. The method further includes retrieving first parametric data associated with the stage for the first item and identifying one or more defect indicators based on the first parametric data and second parametric data associated with the stage for one or more second items having defects associated with the stage. The method also includes monitoring subsequent parametric data associated with the stage to recognize the one or more defect indicators in the subsequent parametric data."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Defect detection during an automated production process","description":"Described herein are improvements for identifying defects during automated item production. In one example, a method includes identifying a first defect in a first item. The first defect is associated","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11287807","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11287807","citation_suggestion":"Patentable. \"Defect detection during an automated production process\" (US-11287807). https://patentable.app/patents/US-11287807","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11287807","json":"https://patentable.app/api/llm-context/US-11287807","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-30T18:46:43.523Z"}