{"schema_version":"1.0","canonical_url":"https://patentable.app/patents/US-11288428","patent":{"patent_number":"US-11288428","title":"Integrated circuit design modification for localization of scan chain defects","assignee":null,"inventors":[],"filing_date":"2020-10-30T00:00:00.000Z","publication_date":"2022-03-29T00:00:00.000Z","cpc_codes":["G06F","G06F"],"num_claims":20,"abstract":"An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where the scan path may include a first scan cell and a second scan cell such that the first scan cell is downstream with respect to the second scan cell. The scan chain may be modified to enable observation of a 0 and a 1 value in the first scan cell in presence of a defect in the second scan cell, or observation of a 0 and a 1 value in the second scan cell in presence of a defect in the first scan cell."},"analysis":{"summary":null,"layman_explanation":null,"technical_analysis":null,"business_analysis":null,"faqs":null,"topics":[],"tech_cluster":null},"seo":{"title":"Integrated circuit design modification for localization of scan chain defects","description":"An integrated circuit (IC) design comprising a scan chain may be received, where stimulus values may be scanned-in and response values may be scanned-out through a scan path in the scan chain, where t","keywords":[]},"attribution":{"source":"Patentable","source_url":"https://patentable.app","canonical_url":"https://patentable.app/patents/US-11288428","license":"CC-BY-4.0-like","license_terms":"AI-generated analysis on this page (summary, layman_explanation, technical_analysis, business_analysis, faqs) may be reused with attribution and a visible link back to the canonical URL above. Patent abstracts, claims, and bibliographic data are USPTO public domain.","required_link":"https://patentable.app/patents/US-11288428","citation_suggestion":"Patentable. \"Integrated circuit design modification for localization of scan chain defects\" (US-11288428). https://patentable.app/patents/US-11288428","copyright_holder":"Nomic Interactive Technology LLC"},"links":{"html":"https://patentable.app/patents/US-11288428","json":"https://patentable.app/api/llm-context/US-11288428","site":"https://patentable.app","llms_txt":"https://patentable.app/llms.txt"},"generated_at":"2026-05-31T20:34:11.147Z"}